小心Ubuntu谋杀你的笔记本硬盘?

[knight.lai]

小心Ubuntu谋杀你的笔记本硬盘http://www.sina.com.cn 2007年11月01日 11:50

现已确认，Ubuntu系统的ACPI电源管理机制存在缺陷，会大幅减少笔记本硬盘的寿命。

如果安装了Ubuntu的笔记本用户转入电池供电模式，则“/etc/acpi/power.sh”中的默认配置会导致极其频繁的载入循环，报告称100小时即可达到7000多次，而资料显示大多数笔记本硬盘最多只能承受60万次这种循环。换算下来，这相当于一块全新的笔记本硬盘只能连续实用不到1年。

SATA硬盘用户可以安装硬盘检测工具Smartmontools检查一下自己的笔记本，输入“smartctl -d ata -a /dev/sda”命令即可查看载入循环次数。

在IBM ThinkPad Z60m/T43、HP Compaq nw9440等笔记本上都已确认了这一bug


很想知道这个是真的吗?

[majia]

这个和ubuntu无关 硬盘总是要换得，平常做好备份就行乐。我这个本子硬盘用了好多年了 一直都是U，也到换的时候了，就等着坏呢。

[yysq009]

这"新"闻 还在扯？

[xuco]

哪个是这个扯了很久的循环次数？？？？我的这个笔记本才买来几天


xxxx$ sudo smartctl -d ata -a /dev/sda

smartctl version 5.37 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Model Family: Western Digital Scorpio family
Device Model: WDC WD1200BEVS-22UST0
Serial Number: WD-WXE608P42670
Firmware Version: 01.01A01
User Capacity: 120,034,123,776 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Tue Oct 21 22:56:25 2008 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (4800) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 60) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 161 160 021 Pre-fail Always - 950
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 29
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 100 253 051 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 19
10 Spin_Retry_Count 0x0013 100 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 28
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 5
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 640
194 Temperature_Celsius 0x0022 098 092 000 Old_age Always - 45
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0009 100 253 051 Pre-fail Offline - 0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

[xuco]

硬盘的Load/Unload Cycle增长肯定会对硬盘的使用寿命/稳定性造成影响。过大的
Load/Unload Cycle 增长会造成磁头磨损，导致数据的读写失败，最终将影响硬盘无
法再进行数据存储。

[xuco]

11 Calibration_Retry_Count 0x0012 100 253 051 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 28
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 5
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 683

20分钟前的193 Load_Cycle_Count 是 640，这样就是 43／20＝2 次／分钟

[poet]

拜托，楼主快回火星吧，地球很危险的。